关键词:
Energy
Chemistry
Aerospace engineering
Analytical chemistry
Computer science
Engineering
Materials science
Medical imaging
Physical geography
摘要:
Graphitic materials describe those containing carbon within a honeycomb lattice structure and have attracted vast interest due to their novel and advantageous properties. Whilst large amounts of work have been conducted to investigate the nature of such materials, in the context of graphite, graphene and other carbon allotropes, there are still many voids in our understanding of these materials, extending to their structure, modification, characterisation, and application. Plasma-exfoliation offers a facile approach towards the large-scale synthesis of partially oxidised, multilayered stacks of graphitic layers. Within the scope of this thesis, plasma-exfoliated multilayer graphitic materials (NPs) are investigated in detail using a vast array of characterisation techniques to reveal information regarding their morphology, structure and elemental composition; including X-ray Photoelectron Spectroscopy (XPS), Raman spectroscopy, X-ray Diffraction (XRD), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Atomic Force Microscopy (AFM), gas physisorption analysis, Nuclear Magnetic Resonance Spectroscopy (NMR), Fourier-Transform Infrared Spectroscopy (FT-IR), Thermogravimetric Analysis (TGA) and Energy-Dispersive X-ray (EDX) analysis. Various novel functionalisation strategies are also explored to covalently and non-covalently functionalise NPs. Initially, an aryl boronic acid precursor is utilised as a radical source to provide a facile route towards the covalent functionalisation of NP. Such a methodology serves to identify safer aryl radical precursors as an alternative to commonly employed diazonium salt reagents, which are typically hazardous and undesirable for large-scale application. This functionalisation strategy enables the covalent attachment of 4-(trifluoromethyl)phenyl moieties to the edges of NP1 stacks. A percentage atomic composition (at.%) of 3.5 fluorine incorporation is revealed via XPS and Raman spectroscopy, TGA, FT-IR and E