摘要:
Gui Yun Tian 1,2 and Lalita Udpa 3 and Raimond Grimberg 4 and B. P. C. Rao 5 and Shenfang Yuan 6 1, School of Electrical and Electronic Engineering, Newcastle University, Newcastle upon Tyne, NE1 7RU, UK 2, School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China 3, Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI 48824, USA 4, Nondestructive Testing Department, National Institute of Research and Development for Technical Physics, 47 D. Mangeron Boulevard, 700050 Iasi, Romania 5, Metallurgy and Materials Group, EMSI Section, NDE Division, Indira Gandhi Centre for Atomic Research (IGCAR), Kalpakkam 603 102, India 6, The Aeronautic Key Lab for Smart Materials and Structures, Nanjing University of Aeronautics and Astronautics Nanjing 210016, China Received 25 June 2012; Accepted 25 June 2012 This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.